Semiconductor Process Reliability in Practice
by Zhenghao Gan,Waisum Wong,Juin Liou
ISBN 13: 9780071754279
Format: Illustrated (624 pages) Publisher: McGraw-Hill Education Published: 16 Nov 2012
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Springer Series in Reliability Engineering)
by Cher Ming Tan,Wei Li,Zhenghao Gan,Yuejin Hou
ISBN 13: 9781447126416
Format: Paperback (160 pages) Publisher: Springer Published: 21 Apr 2013